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Effect of doping in the current voltage characteristics of organic diodes

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We analyze the effects of doping, traps and other defects on the electronic properties of organic/polymeric diodes. We detect the presence of dopant atoms and traps in the semiconductor in experimental current density-voltage (j-V) curves by the comparison with numerical j-V curves. The transport equations are solved by means of the Lambert-W-function. The key parameter in the procedure is the boundary value for the free carrier density at the metal-organic interface.

Original languageEnglish
Title of host publicationProceedings of the 2015 10th Spanish Conference on Electron Devices, CDE 2015
EditorsAngel Luis Alvarez Castillo, Ma. del Carmen Coya Parraga
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479981083
DOIs
StatePublished - 16 Apr 2015
Externally publishedYes
Event10th Spanish Conference on Electron Devices, CDE 2015 - Aranjuez, Madrid, Spain
Duration: 11 Feb 201513 Feb 2015

Publication series

NameProceedings of the 2015 10th Spanish Conference on Electron Devices, CDE 2015

Conference

Conference10th Spanish Conference on Electron Devices, CDE 2015
Country/TerritorySpain
CityAranjuez, Madrid
Period11/02/1513/02/15

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