Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays

Kitty Urbano; Wilver Auccahuasi; Sandra Meza; Rosalynn Ornella Flores-Castameda; Miryam Cosme; Percy Castro

doi:10.1109/ICSCSA66339.2025.11171328

Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays

Kitty Urbano
, Wilver Auccahuasi
, Sandra Meza
, Rosalynn Ornella Flores-Castameda
, Miryam Cosme
, Percy Castro

Research group on information and communication systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	2125-2128
Number of pages	4
ISBN (Electronic)	9798331594916
DOIs	https://doi.org/10.1109/ICSCSA66339.2025.11171328
State	Published - 1 Jan 2025
Event	5th International Conference on Soft Computing for Security Applications, ICSCSA 2025 - Salem, India Duration: 4 Aug 2025 → 6 Aug 2025

Publication series

Name	Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025

Conference

Conference	5th International Conference on Soft Computing for Security Applications, ICSCSA 2025
Country/Territory	India
City	Salem
Period	4/08/25 → 6/08/25

Access to Document

10.1109/ICSCSA66339.2025.11171328

Cite this

Urbano, K., Auccahuasi, W., Meza, S., Flores-Castameda, R. O., Cosme, M., & Castro, P. (2025). Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays. In Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025 (pp. 2125-2128). (Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSCSA66339.2025.11171328

Urbano, Kitty ; Auccahuasi, Wilver ; Meza, Sandra et al. / Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays. Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025. Institute of Electrical and Electronics Engineers Inc., 2025. pp. 2125-2128 (Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025).

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title = "Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays",

keywords = "Phantom, X-ray, analysis, imaging, methodology",

author = "Kitty Urbano and Wilver Auccahuasi and Sandra Meza and Flores-Castameda, \{Rosalynn Ornella\} and Miryam Cosme and Percy Castro",

note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025 ; Conference date: 04-08-2025 Through 06-08-2025",

year = "2025",

month = jan,

day = "1",

doi = "10.1109/ICSCSA66339.2025.11171328",

language = "English",

series = "Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "2125--2128",

booktitle = "Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025",

}

Urbano, K, Auccahuasi, W, Meza, S, Flores-Castameda, RO, Cosme, M & Castro, P 2025, Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays. in Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025. Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025, Institute of Electrical and Electronics Engineers Inc., pp. 2125-2128, 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025, Salem, India, 4/08/25. https://doi.org/10.1109/ICSCSA66339.2025.11171328

Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays. / Urbano, Kitty; Auccahuasi, Wilver; Meza, Sandra et al.
Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025. Institute of Electrical and Electronics Engineers Inc., 2025. p. 2125-2128 (Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays

AU - Urbano, Kitty

AU - Auccahuasi, Wilver

AU - Meza, Sandra

AU - Flores-Castameda, Rosalynn Ornella

AU - Cosme, Miryam

AU - Castro, Percy

PY - 2025/1/1

Y1 - 2025/1/1

KW - Phantom

KW - X-ray

KW - analysis

KW - imaging

KW - methodology

UR - https://www.scopus.com/pages/publications/105018459297

U2 - 10.1109/ICSCSA66339.2025.11171328

DO - 10.1109/ICSCSA66339.2025.11171328

M3 - Conference contribution

AN - SCOPUS:105018459297

T3 - Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025

SP - 2125

EP - 2128

BT - Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025

Y2 - 4 August 2025 through 6 August 2025

ER -

Urbano K, Auccahuasi W, Meza S, Flores-Castameda RO, Cosme M, Castro P. Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays. In Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025. Institute of Electrical and Electronics Engineers Inc. 2025. p. 2125-2128. (Proceedings of 5th International Conference on Soft Computing for Security Applications, ICSCSA 2025). doi: 10.1109/ICSCSA66339.2025.11171328

Methodology for the Analysis of Materials, based on the Analysis of Phantoms by Means of X-rays

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