TY - JOUR
T1 - Adapting to a New Normal
T2 - Peruvian University Faculty’s Experiences with Techno-Stress Post-COVID-19
AU - Suyo-Vega, Josefina Amanda
AU - Meneses-La-Riva, Monica Elisa
AU - Fernández-Bedoya, Víctor Hugo
N1 - Publisher Copyright:
Copyright: © 2024 Suyo-Vega JA et al.
PY - 2024/1/1
Y1 - 2024/1/1
N2 - Background: Technology enhances teaching and learning quality, yet when educators lack tech proficiency, it hinders effective education and leads to frustration, lower confidence, and self-doubt. This study aims to investigate the experiences of university faculty members in relation to the impact of technology on their mental well-being. Methods: Using a qualitative approach (grounded theory), ten university faculty members were selected for in-depth interviews based on criteria such as teaching experience, tenure, specific courses or subjects taught, and active engagement during the research period. The guiding research question, “What are the experiences and perceptions of university faculty members concerning techno-stress?” directed the study’s focus. The instrument (interview guide) that measured techno-stress consisted of 12 items and was administered virtually. Data were analyzed thematically to uncover common stressors, adaptive strategies, and institutional challenges faced by faculty in adapting to technology’s demands and work overload. Additionally, the study identified four subcategories: work overload, social and emotional interaction, adaption to new technologies, and expectations and teaching quality. Results: Techno-stress is a composite of emotional and physical reactions triggered by the improper use of technology. Faculty members’ encounters with techno-stress have substantial implications for their quality of life. Conclusions: This research highlights technology’s positive impact on higher education but notes faculty struggles with techno-stress, emphasizing the need for training, support, and boundaries to maintain work-life balance and enhance educational quality.
AB - Background: Technology enhances teaching and learning quality, yet when educators lack tech proficiency, it hinders effective education and leads to frustration, lower confidence, and self-doubt. This study aims to investigate the experiences of university faculty members in relation to the impact of technology on their mental well-being. Methods: Using a qualitative approach (grounded theory), ten university faculty members were selected for in-depth interviews based on criteria such as teaching experience, tenure, specific courses or subjects taught, and active engagement during the research period. The guiding research question, “What are the experiences and perceptions of university faculty members concerning techno-stress?” directed the study’s focus. The instrument (interview guide) that measured techno-stress consisted of 12 items and was administered virtually. Data were analyzed thematically to uncover common stressors, adaptive strategies, and institutional challenges faced by faculty in adapting to technology’s demands and work overload. Additionally, the study identified four subcategories: work overload, social and emotional interaction, adaption to new technologies, and expectations and teaching quality. Results: Techno-stress is a composite of emotional and physical reactions triggered by the improper use of technology. Faculty members’ encounters with techno-stress have substantial implications for their quality of life. Conclusions: This research highlights technology’s positive impact on higher education but notes faculty struggles with techno-stress, emphasizing the need for training, support, and boundaries to maintain work-life balance and enhance educational quality.
KW - Adapting to technology
KW - Mental well-being
KW - Qualitative study
KW - Teaching and learning
KW - Techno-stress
KW - Technology
KW - Work overload
UR - https://www.scopus.com/pages/publications/85210018608
U2 - 10.12688/f1000research.141432.3
DO - 10.12688/f1000research.141432.3
M3 - Article
C2 - 39563994
AN - SCOPUS:85210018608
SN - 2046-1402
VL - 12
JO - F1000Research
JF - F1000Research
M1 - 1381
ER -