TY - JOUR
T1 - Influencia de la ferrita de cobalto en la propiedades magnetoeléctricas de las películas delgadas de ferrita de bismuto depositadas por spin coating
AU - Rojas Flores, Segundo Jonathan
AU - Gallozzo Cardenas, Moises Miguel
AU - Naveda, Renny Randy Nazario
AU - Cortijo, Luisa Amparo Juárez
AU - Yupanqui, Magda Rubi Rodriguez
AU - Silva, Luis Manuel Angelats
AU - Odar, Fenando Enrique Ugaz
N1 - Publisher Copyright:
© 2020, Universidade Federal do Rio de Janeiro. All rights reserved.
PY - 2020
Y1 - 2020
N2 - The films composed of (1-x) BiFeO3- (x) CoFe2O4 varying the concentration (x = 0, 0.1, 0.2 and 0.3) were deposited by spin coating on Pt substrate (Pt / TiO2 / SiO2 / Si) from of 0.05 molar concentration precursors solutions, which were obtained by sol-gel method. Thin films characterization was made, the structure and the magnetoelectric properties were studied using X-ray diffraction, leakage current, dielectric constant, fer-roelectric and ferromagnetic hysteresis curve. The XRD results show characteristic peaks with the formation of BiFeO3 and the growth of peaks belonging to CoFe2O4 with the increase of x. All samples reveal little leakage current, being the lowest of 10-10 A/cm2 for (0.8) BiFeO3- (0.2) CoFe2O4. The dielectric constant in-creased in the range from 102 Hz to 105 Hz then decreased due to dielectric relaxation, for all samples the dielectric loss is less than 4%. All fabricated films show remnants polarization and magnetization greater than 60 µC/cm2 and 30 emu/gr respectively.
AB - The films composed of (1-x) BiFeO3- (x) CoFe2O4 varying the concentration (x = 0, 0.1, 0.2 and 0.3) were deposited by spin coating on Pt substrate (Pt / TiO2 / SiO2 / Si) from of 0.05 molar concentration precursors solutions, which were obtained by sol-gel method. Thin films characterization was made, the structure and the magnetoelectric properties were studied using X-ray diffraction, leakage current, dielectric constant, fer-roelectric and ferromagnetic hysteresis curve. The XRD results show characteristic peaks with the formation of BiFeO3 and the growth of peaks belonging to CoFe2O4 with the increase of x. All samples reveal little leakage current, being the lowest of 10-10 A/cm2 for (0.8) BiFeO3- (0.2) CoFe2O4. The dielectric constant in-creased in the range from 102 Hz to 105 Hz then decreased due to dielectric relaxation, for all samples the dielectric loss is less than 4%. All fabricated films show remnants polarization and magnetization greater than 60 µC/cm2 and 30 emu/gr respectively.
KW - Ferromagnetic and ferroelectric
KW - Films
KW - Magnetoelectric
UR - http://www.scopus.com/inward/record.url?scp=85083832453&partnerID=8YFLogxK
U2 - 10.1590/s1517-707620200001.0871
DO - 10.1590/s1517-707620200001.0871
M3 - Artículo
AN - SCOPUS:85083832453
SN - 1517-7076
VL - 25
JO - Revista Materia
JF - Revista Materia
IS - 1
M1 - e-12546
ER -